Our materials scientists use the latest micro-characterization techniques to better understand and improve the micro/nano-structure of materials. The micro/nano-structural research complements the mechanical and physical property research as well as plays an important role in educational outreach and training.
The Zeiss 1540EsB is a multi-technique dual beam (electron and Ga ion) field emission Scanning Electron Microscope (SEM) with a spatial resolution for imaging of 1 nanometer (0.8 nm STEM).
This 200 kV transmission electron microscope is fitted with a LaB6 filament and has a lattice and point resolutions of 0.14 nm and 0.23 nm, respectively.
This state-of-the-art s/TEM, incorporating a probe spherical aberration corrector for electron optic system and the maximum level of electrical and mechanical stability, has achieved a scanning transmission image (STEM-HAADF) resolution of 0.078 nm, the highest in the world among the commercial transmission electron microscopes.
This optical microscope (REICHERT MEF4M Metallograph with Digital Imaging Acquisition and Analysis) is an inverted wide field Metallograph with a high degree of automation.
In recognition of the fact that sample preparation is important in materials characterization, our laboratory has extensive facilities for metallographic, scanning electron microscopy (SEM) and transmission electron microscopy (TEM) sample preparation.
The FEI Helios G4 UC is a multi-technique dual beam (electron and Ga ion) Field Emission Scanning Electron Microscope (FESEM) with a spatial resolution for imaging of 0.7 nanometer.
This is a state-of-the-art dual beam field emission Scanning Electron Microscope (SEM) with an ultimate resolution of 1 nanometer.