Dielectric capacitance measures capacitance and dissipation of a bulk or thin film sample.
The measurement (tan δ) is performed using capacitance bridges, which automatically or manually balances the capacitance and dissipation of the sample with known standards. When a sample is prepared to a parallel capacitor geometry, the capacitance and the dissipation can be converted to real and imaginary part of dielectric constant (ε′ and ε″ respectively) using relations of C=ε0 ε′ Area ⁄ (thickness) and tan δ= ε″ ⁄ ε′ , where ε0 is permittivity of air.
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Last modified on 26 December 2022