FIB lithography allows reducing sample cross-section as well as making electrical contacts on sub-micron scale, making possible current densities as high as MA cm2. FPGA logic can track and respond to changes in sample properties (e.g. onset of dissipation) within microseconds, protecting the sample and recording the signal.
Instrumentation
- National Instruments, Xilinx, 4DSP FPGA DAQ devices
Images & Sample Data
Click on an image for larger view and details.
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A nano-bridge for Jc measurements.
A nano-bridge for Jc measurements.
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Jc measurement in pulsed fields.
Jc measurement in pulsed fields.
https://nationalmaglab.org/user-facilities/pulsed-field-facility/pff-measurement-techniques/high-current-jc-jan-pff?tmpl=component&print=1#sigProId3e68caef8a
Related Publications
P.J.W. Moll, et al, High magnetic-field scales and critical currents in SmFeAs(O,F) crystals, Nat. Mater. 9 (2009) Read online
S.A. Baily, et al, Pseudoisotropic Upper Critical Field in Cobalt-Doped SrFe2As2, Phys. Rev. Lett. 102 (2009) Read online
F.F. Balakirev, et al, Quantum phase transition in the magnetic-field-induced normal state of optimun-doped high-TC cuperate superconductors at low temperatures, Phys. Rev. Lett. 102 (2009) Read online