By measuring changes in the frequency, we can detect changes in the penetration depth of a superconductor, the susceptibility of a magnetic system or the surface conductivity of a metal. The absence of contacts connected to the sample allows this technique to produce less strain than conventional transport for fragile samples.
Images & Sample Data
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- Tunnel diode oscillator circuit board. Tunnel diode oscillator circuit board.
- TDO circuit frequency vs applied magnetic field. TDO circuit frequency vs applied magnetic field.
- Background subtracted magnetic field sweeps. Background subtracted magnetic field sweeps.
- Frequency counter
- Frequency generators
- RF pre-amplifiers, mixers and splitters
R. L. Stillwell, et al, Pressure-driven Fermi surface reconstruction of chromium, Physical Review B 88 (2013) Read online
S. Ghannadzadeh, et al, Evolution of magnetic interactions in a pressure-induced Jahn-Teller driven magnetic dimensionality switch, Physical Review B 87 (2013) Read online
D. Graf, et al, Pressure dependence of the BaFe2As2 Fermi surface within the spin density wave state, Physical Review B 85 (2012) Read online
C. Martin, et al, Evidence for the Fulde-Ferrell-Larkin-Ovchinnikov state in CeCoIn5 from penetration depth measurements, Physical Review B 71 (2005) Read online
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