By measuring changes in the frequency, we can detect changes in the penetration depth of a superconductor, the susceptibility of a magnetic system or the surface conductivity of a metal. The absence of contacts connected to the sample allows this technique to produce less strain than conventional transport for fragile samples.
Images & Sample Data
Click on images to view a larger version, to download or to view more details.
-
Tunnel diode oscillator circuit board.
Tunnel diode oscillator circuit board.
-
TDO circuit frequency vs applied magnetic field.
TDO circuit frequency vs applied magnetic field.
-
Background subtracted magnetic field sweeps.
Background subtracted magnetic field sweeps.
https://nationalmaglab.org/user-facilities/dc-field/dcfield-techniques/contactless-conductivity-dc#sigProIdfb8e8f7a62
Instrumentation
Resistive Magnets
- 31 Tesla, cell 7
- 31 Tesla, cell 9
- 35 Tesla, cell 8
- 35 Tesla, cell 12
- 36 Tesla, cell 14
- 45 Tesla, cell 15
Superconducting Magnets
- Frequency counter
- Frequency generators
- RF pre-amplifiers, mixers and splitters
- Oscilloscope
Related Publications
R. L. Stillwell, et al, Pressure-driven Fermi surface reconstruction of chromium, Physical Review B 88 (2013) Read online
S. Ghannadzadeh, et al, Evolution of magnetic interactions in a pressure-induced Jahn-Teller driven magnetic dimensionality switch, Physical Review B 87 (2013) Read online
D. Graf, et al, Pressure dependence of the BaFe2As2 Fermi surface within the spin density wave state, Physical Review B 85 (2012) Read online
C. Martin, et al, Evidence for the Fulde-Ferrell-Larkin-Ovchinnikov state in CeCoIn5 from penetration depth measurements, Physical Review B 71 (2005) Read online
Staff Contact
For more information, please contact: