Low Temperature Laser Scanning Microscope

Low temperature laser scanning microscope. Low temperature laser scanning microscope.

This technique allows us to visualize the voltage change responses on local heating from low power diode laser at constant bias current at temperatures 3.7 K – 300 K with magnetic fields up to 5 tesla.

In experiments with thin film superconductors the voltage change response is proportional to the local electric field, while a sample is cooled below the transition temperature and biased with current above the critical current. The laser microscope is capable of measuring simultaneously the voltage change response with resolution down to 2-3 μm and the intensity of reflected light with resolution <1 μm.

Last modified on 9 January 2015