Publications and Scientific Activities

2015

1. Frequency-Multiple Detection Compatible with Optimized Ion Trap Geometry for Enhanced Fourier Transform Ion Cyclotron Resonance Mass Spectral Resolution Chen, T.; Beu. S.C.; Kaiser, N.K.; Quinn, J.P.; McIntosh, D.G.; Williams, V.; Marshall, A.G. and Hendrickson, C.L. 63rd Amer. Soc. for Mass Spectrometry Conference on Mass Spectrometry and Allied Topics St. Louis, Missouri, United States May 31 – June 5 (2015)

2014

1. From Simulation, Construction and Experimental Characterization of A Modified Dynamically Harmonized FT-ICR Cell Chen, T.; Kaiser, N.K.; Weisbrod, C.R.; Beu, S.C.; Blakney, G.T.; Quinn, J.P.; McIntosh, D.G.; Williams, V.; Hendrickson, C.L. and Marshall, A.G. 62nd Amer. Soc. for Mass Spectrometry Conf. on Mass Spectrometry & Allied Topics Baltimore, Maryland, United States June 15-19 (2014)

2006

1. Fermiology and superconductivity at high magnetic fields in a completely organic cation radical salt Brooks, J.S.; Williams, V.; Choi, E.; Graf, D.; Tokumoto, M.; Uji, S.; Zuo, F.; Wosnitza, J.; Schlueter, J. A.; Davis, H.; Winter, R.W.; Gard, G.L. and Storr, K. New Journal of Physics, 8, 25 (2006)

2002

1. A new tool for measuring polar magneto-optical Kerr hysteresis curves at high fields and low temperatures Geerts, W.J.; Donehew, B.; Williams, V. and Schmiedel, T. Review of Scientific Instruments, 73, 5, 5 (2002)

2000

1. Design of 30 T Split-Pair Pulse Coils for LANSCE Painter, T.; Bole, S.; Eyssa, Y.; Dixon, I.; Williams, V.; Maier, S.; Gundlach, S.; Tozer, S.; Hascicek, Y. and Ammerman, C. IEEE Transactions on Applied Superconductivity, 10, 1, 538-541 (2000)
2. Conductor and Reinforcement Materials for the Los Alamos Neutron Science Center 30 T Split-Pair and Future Pulse Coils Painter, T.; Walsh, R.; Williams, V.; Toplosky, V. and Maier, S. IEEE Transactions on Applied Superconductivity, 10, 1, 1292-1295 (2000)

1999

1. Fabry-Perot resonator for high-field multi-frequency ESR at millimetre and submillimetre wavelengths Rohrer, M.; Krzystek, J.; Williams, V. and Brunel, L.-C. Measurement Science and Technology, 10, 275-284 (1999)